LSI testing
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美
【计】大规模集成电路测试
双语例句
- The experimental results indicate that the method improves classification performance with more compact representation when less time of training and testing is required than that of LSI.
实验表明当需要比LSI更少的训练和测试时间时，该方法能够以更为紧凑的表示方式提高分类性能。 - The Need for Time Testing in Memories and LSI Circuits
对存储器和LSI电路时间测试的要求 - Program-controlled Scanner and Its Application in Automatic Testing System for LSI
程控扫描器及其在LSI自动检测系统中的运用